The OmniScan MX A Field-Proven, Dependable Instrument

With thousands of units being used throughout the world, the OmniScan® MX is a field-proven, reliable instrument that is built to withstand harsh and demanding inspection conditions. Compact and lightweight, its two Li-ion batteries provide up to 6 hours of manual or semi-automated inspection time.

 

The highly legible 8.4 in. (213 mm) real-time color display of the OmniScan MX enables you to see defects and details under any light conditions. Navigate your way through the instrument’s simple and intuitive interface using the scroll knob and function keys, or by connecting a USB mouse to facilitate the inspection analysis.

 

 

One Platform, Two Modules, Three Technologies: More Flexibility

To meet the requirements of a broader range of applications, eddy current testing (ECT), eddy current array (ECA) and the new bond testing (BT) C-scan technology are available in two module versions. Both of these modules are compatible with the MXE (ECT/ECA) and MXB (BT C-scan) software, providing easy transition between technologies and a very short learning curve.

 

 

ECA is just like ECT
Large Coverage, Fast Scanning, and Higher Probability of Detection

Eddy current array (ECA) technology incorporates several traditional bridge or reflection (driver-pickup) probe coils in order to achieve a much larger coverage in a single inspection pass. Additionally, each ECA probe model is carefully designed to maintain a high probability of detection of a targeted defect range, all along the probe length. With the OmniScan® MX ECA, you can use ECA probes at fast manual-inspection speeds, offering a powerful and productive inspection with color representation and archiving capability.

 

 

Inspection through Thin Coatings

Eddy current testing (ECT) technology works on the principle of magnetic coupling of a probe sensor (coil) close to a test specimen (conductive material, ferromagnetic or non-ferromagnetic), generating eddy currents inside the test specimen, and displaying signals on the instrument’s impedance plane. With eddy current technology, you can detect defects through thin coatings (such as paint), as long as the distance from the probe to the metal is kept reasonably low—typically in the order of 0.5 mm to 2.0 mm.

As eddy current array and ECT technology share the same basic principles (and physics), it can also perform inspections through paint while offering all advantages of ECA, including large coverage, fast scanning, high probability of detection and color imaging.

 

 

Probes used to perform eddy current inspections are made with a copper wire wound to form a coil. The coil shape can vary to better suit specific applications.   1. The alternating current flowing through the coil at a chosen frequency generates a magnetic field around the coil. 2. When the coil is placed close to an electrically conductive material, an eddy current is induced in the material. 3. If a flaw in the conductive material disturbs the eddy current circulation, the magnetic coupling with the probe is changed and a defect signal can be read by measuring the coil impedance variation.

PreviousNext